Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1589282 | Micron | 2010 | 7 Pages |
Abstract
We consider the utility of phase-retrieval methods in low energy electron microscopy (LEEM). Computer simulations are presented, demonstrating recovery of the terraced height profile of atomic steps. This recovery uses phase retrieval to decode a single LEEM image, incorporating the effects of defocus, spherical aberration and chromatic aberration. The ability of the method, to obtain temporal sequences of evolving step profiles from a single LEEM movie, is discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
R.P. Yu, S.M. Kennedy, D.M. Paganin, D.E. Jesson,