| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1589356 | Micron | 2012 | 6 Pages |
Abstract
⺠In this work we introduce a new parameter called localization factor. ⺠This parameter is applied for the characterization of contact-AFM images. ⺠The application of this parameter is beneficial in areas which require information about the surface structure. ⺠AFM images obtained on different gold thin film surfaces were evaluated. ⺠The localization factor was compared with the surface roughness and roughness factor.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Attila Bonyár, László Milán Molnár, Gábor Harsányi,