Article ID Journal Published Year Pages File Type
1589394 Micron 2012 7 Pages PDF
Abstract
► ABF STEM visualizes a contrast of light elements. ► Experimental parameters for the method were reported. ► The contrast of the light elements was explained by diffraction imaging technique. ► The contrast of the ABF is insensitive to the sample thickness and defocus.
Keywords
Related Topics
Physical Sciences and Engineering Materials Science Materials Science (General)
Preview
Experimental study of annular bright field (ABF) imaging using aberration-corrected scanning transmission electron microscopy (STEM)
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