Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1589725 | Micron | 2009 | 7 Pages |
Abstract
Electron microscopy techniques used for identification of phases present in surface multilayers and some practical limits to their routine application are reminded here.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
A. Czyrska-Filemonowicz, P.A. Buffat,