Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1589749 | Micron | 2009 | 5 Pages |
Abstract
The chemical structure and possible hydro-oxidation of LaNiO3âδ films were studied by means of tuneable high-energy X-ray photoelectron spectroscopy using synchrotron radiation. It was shown that the hydroxyl-containing phase, located near the film surface, may be attributed to the lanthanum and nickel hydroxide species. The thickness of a hydroxide-enriched layer was estimated from the oxide/hydroxide ratio measured at normal and grazing conditions. The hydroxide layer thickness was about 2 nm for step and/or exponential hydroxide spatial distribution.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
S. MickeviÄius, S. Grebinskij, V. Bondarenka, V. Lisauskas, K. Å liužienÄ, H. Tvardauskas, B. Vengalis, B.A. Orlowski, V. Osinniy, W. Drube,