Article ID Journal Published Year Pages File Type
1589749 Micron 2009 5 Pages PDF
Abstract
The chemical structure and possible hydro-oxidation of LaNiO3−δ films were studied by means of tuneable high-energy X-ray photoelectron spectroscopy using synchrotron radiation. It was shown that the hydroxyl-containing phase, located near the film surface, may be attributed to the lanthanum and nickel hydroxide species. The thickness of a hydroxide-enriched layer was estimated from the oxide/hydroxide ratio measured at normal and grazing conditions. The hydroxide layer thickness was about 2 nm for step and/or exponential hydroxide spatial distribution.
Related Topics
Physical Sciences and Engineering Materials Science Materials Science (General)
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