Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1589773 | Micron | 2010 | 7 Pages |
Abstract
According to our developed methodology and data treatments, Al diffusion profile was interpreted and interphase thickness was qualitatively determined by comparison with an experimental baseline. This innovative methodology promotes the use of LVSEM-EDS in the field of adhesive structural assemblies, but also, deals with a comparative study on the effect of the gas pressure on the EDS profile analysis.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Caroline Sperandio, Claire Arnoult, Abdelghani Laachachi, Jean Di Martino, David Ruch,