| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1589821 | Micron | 2008 | 5 Pages |
Abstract
A synchrotron-based scanning transmission X-ray microscope (STXM) is used to investigate Micronal® phase-change microcapsules. Prolonged X-ray illumination of the specimen leads to the breaking of the microcapsules' protective polymer shell and a partial separation of the core-shell species occurs. The paraffin wax and acrylic polymer components are characterized by carbon K-edge near X-ray edge absorption fine structure (NEXAFS) spectroscopy and components distribution mapping of the beam-damaged specimen is performed.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
G. Tzvetkov, B. Graf, R. Wiegner, J. Raabe, C. Quitmann, R. Fink,