Article ID Journal Published Year Pages File Type
1590230 Micron 2007 4 Pages PDF
Abstract
In order to measure the internal spatial response of a pixel in a detector, it is scanned by a beam smaller than its size. This becomes difficult as the wave length grows and becomes comparable to the pixel size, such as in the infra red. To overcome this difficulty, a special phase mask which makes the beam narrower was designed, constructed, and tested successfully. The mask was made from five alternating transparent rings, where the rings had half a wave phase difference between them. The beam was scanned with and without the mask in two dimensions in fine steps by a much smaller detector and its response was taken. The spot width dropped by 19% at half its height and by 42% at tenth its height, a significant narrowing. The scan was repeated with the full detector pixel. That beam scan served as a deconvolution kernel and allowed us to find the pixel point spread function (spatial response), the pixel modulation transfer function and the optical cross talk between the pixels.
Related Topics
Physical Sciences and Engineering Materials Science Materials Science (General)
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