Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1590701 | Progress in Crystal Growth and Characterization of Materials | 2006 | 7 Pages |
Abstract
In the present paper, a theoretical investigation has been carried out to estimate the lifetime of the minority carriers of n-InAsSb arising out of various recombination mechanisms e.g. radiative recombination, SRH recombination and Auger recombination. It is seen that among the three dominant recombination mechanisms Auger recombination is most significant at or near room temperature when the doping concentration ranges from 1023 to 1025 m−3. The high value of Auger recombination lifetime of carries at room temperature would adversely affect the performance of optoelectronic devices based on InAsSb.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
R.K. Lal, P. Chakrabarti,