Article ID Journal Published Year Pages File Type
1590808 Science and Technology of Advanced Materials 2007 5 Pages PDF
Abstract
Step and terrace structure has been observed in an area of 1 μm×1 μm on the cleaved surface of KCl-KBr solid-solution single crystal by scanning near-field optical microscope (SNOM) with a small sphere probe of 500 nm diameter. Lateral spatial resolution of the SNOM system was estimated to be 20 nm from the observation of step width and the scanning-step interval. Vertical spatial resolution was estimated to be 5-2 nm from the observation of step height and noise level of photomultiplier tube (PMT). With applying a dielectric dipole radiation model to the probe surface, the reason why such a high spatial resolution was obtained in spite of the 500 nm sphere probe, was understood as the effect of the near-field term appeared in the radiation field equations.
Related Topics
Physical Sciences and Engineering Materials Science Materials Science (General)
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