Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1590904 | Science and Technology of Advanced Materials | 2006 | 6 Pages |
Abstract
When a dilute amount of Si is added to Al, it results in the precipitation of Si-phases, either planar- and/or rod-type, depending on the ageing conditions. Observation of these phases had been carried out by TEM two dimensionally so far; nevertheless information of the thickness as well as the distribution had been neglected in the past. In this paper, a combination of electron diffraction, high-resolution transmission electron microscopy, and three-dimensional electron tomography was applied to characterize the morphologies and the orientation relationship of the Si-phases in an Al-Si alloy.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Kenji Kaneko, Ryo Nagayama, Koji Inoke, Etsuko Noguchi, Zenji Horita,