| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1590947 | Science and Technology of Advanced Materials | 2006 | 5 Pages |
Abstract
We report high-resolution angle-resolved photoemission spectroscopy (ARPES) on high quality single crystal of graphite (kish graphite) to elucidate the origin of anomalous physical properties of carbon-based materials. We found an almost flat band in the vicinity of the Fermi level around the K(H) point which is not predicted by the bulk band calculation. We discuss the origin of this anomalous structure in relation to the edge-localized state on the step edges of cleaved surface.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
K. Sugawara, T. Sato, S. Souma, T. Takahashi, H. Suematsu,