| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1592645 | Solid State Communications | 2012 | 4 Pages |
We report the transmittance (T ) and the pump–probe transmittance change (ΔT)(ΔT) of Nd0.5Sr0.5MnO3 (NSMO) thin films grown on SrTiO3(STO)(100) and STO(110) substrates in 1.3–1.7 eV range at room temperature. The strain of NSMO was isotropic on STO(100) and anisotropic on STO(110). Both T and ΔTΔT showed no polarization dependence in NSMO/STO(100) but the intensity of T and ΔTΔT was anisotropic in NSMO/STO(110). Also ΔTΔT showed sharp exponential decay with increasing time delay between the pump and probe pulse. The short time decay behaviour (≲0.3ps) showed no significant polarization direction and substrate dependence, which indicates that the carrier–carrier scattering rate is not sensitive to the strain state in NSMO.
► We grow two Nd0.5Sr0.5MnO3 thin films. ► One is istoropically strained and the other one is anisotropically strained. ► We measured the transmittance and the time-dependent transmittance change. ► The isotropic strained thin film showed no polarization dependence. ► The anisotropic strained thin film showed the polarization dependence.
