| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1592956 | Solid State Communications | 2012 | 4 Pages |
High-quality Bi2Te3 microcrystals have been grown by physical vapor transport (PVT) method without using a foreign transport agent. The microcrystals grown under optimal temperature gradient are well facetted and they have dimensions up to ∼100 μm. The phase composition of grown crystals has been identified by X-ray single crystal structure analysis in space group R3̄m, a=4.3896(2) Å, b=30.5019(10) Å, Z=3 (R=0.0271). Raman microspectrometry has been used to describe the vibration parameters of Bi2Te3 microcrystals. The FWHM parameters obtained for representative Raman lines at 61 cm−1 and 101 cm−1 are as low as 3.5 cm−1 and 4.5 cm−1, respectively.
► Growth of Bi2Te3 microcrystals by PVT method from self-vapor. ► X-ray single crystal structure analysis of Bi2Te3 (R=0.0271). ► Raman microspectrometry of Bi2Te3 microcrystals.
