| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1592959 | Solid State Communications | 2012 | 4 Pages |
Abstract
⺠Anisotropic magnetoresistance (AMR) as a measure for the phase coexistence in Co2FeSi layers. ⺠Laterally inhomogeneous distribution of disorder in Co2FeSi films. ⺠Phenomenological model of the thickness dependence of the AMR amplitude. ⺠It enables a quantitative estimation of the volume fraction occupied by the disordered B2 phase in Co2FeSi films. ⺠Results indicate different tetragonal lattice distortions in the B2 and L21 phases of Co2FeSi on GaAs.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
P. Bruski, K.-J. Friedland, R. Farshchi, J. Herfort, M. Ramsteiner,