Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1594487 | Solid State Communications | 2010 | 4 Pages |
Abstract
We report the density and magnetic field dependence of the valley splitting of two-dimensional electrons in (100) Si metal–oxide–semiconductor field-effect transistors, as determined via activation measurements in the quantum Hall regime. We find that the valley activation gap can be greatly enhanced at high magnetic fields as compared to the bare valley splitting. The observation of strong dependence of the valley activation gap on orbital Landau level occupancy and similar behavior of nearby spin gaps suggest that electron–electron interactions play a large role in the observed enhancement.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
L.A. Tracy, K. Eng, K. Childs, M.S. Carroll, M.P. Lilly,