| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1594573 | Solid State Communications | 2008 | 4 Pages |
Abstract
CdSe nanocrystals (NCs) embedded in a solid SiO2 matrix were fabricated by RF-sputtering technique. Raman and photoluminescence spectroscopy illustrated the NCs size dependent confinement effect. The CdSe NCs charging effects were electrically characterized by means of capacitance–voltage measurements. A memory effect was demonstrated through memory window measurements.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
S. Levichev, P. Basa, Zs.J. Horváth, A. Chahboun, A.G. Rolo, N.P. Barradas, E. Alves, M.J.M. Gomes,