| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1594589 | Solid State Communications | 2008 | 4 Pages |
Abstract
The perturbation of external high frequency signals on dynamical current-voltage (I-V) characteristics of tunnel diodes has been investigated experimentally alongside the interaction between the applied signal and the intrinsic frequencies of diodes. The multivalued I-V characteristics, intrinsic bistabilities, regions of frequency lock and amplification, as well as regions of chaotization and ordering of systems have been found.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
K.M. Aliev, I.K. Kamilov, Kh.O. Ibragimov, N.S. Abakarova,