Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1594640 | Solid State Communications | 2009 | 5 Pages |
Abstract
SiGe/Si heterogeneous nanostructures are prepared by electrochemical anodization of SiGe/Si multiple layers grown by ultra-high vacuum chemical vapor deposition. Nanorods with densities up to ∼2×1011 cm−2 have been observed with a relatively uniform distribution confirmed by scanning electron microscope images of both top and cross-sectional views. The samples show visible photoluminescence with multiple peaks and narrow widths which is related to the interference effect. Finally, a model is proposed to explain the role of strain during the anodization of SiGe/Si multiple layers.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Bi Zhou, S.W. Pan, Rui Chen, S.Y. Chen, Cheng Li, H.K. Lai, J.Z. Yu, X.F. Zhu,