Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1594920 | Solid State Communications | 2009 | 8 Pages |
Abstract
The detection of the quantum dot charge state using a quantum point contact charge detector has opened a new exciting route for the investigation of quantum dot devices in recent years. In particular, time-resolved charge detection allowed the precise measurement of quantum dot shot noise at sub-femtoampere current levels, and the full counting statistics of the current. The technique can be applied to different material systems and holds promise for future application in quantum dot based quantum information processing implementations. We review recent experiments employing this charge detection technique, including the self-interference of individual electrons and back-action phenomena.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Thomas Ihn, Simon Gustavsson, Urszula Gasser, Bruno Küng, Thomas Müller, Roland Schleser, Martin Sigrist, Ivan Shorubalko, Renaud Leturcq, Klaus Ensslin,