| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1595187 | Solid State Communications | 2009 | 5 Pages |
The effects of external stress cooperated with temperature, measuring frequency and measuring electric field on the fatigue properties of Bi3.25La0.75Ti3O12 thin films are investigated. The fatigue properties can be improved by the external stress (both tensile and compressive). The larger the stress is, the more obvious the improvement is. Meanwhile, the stress-induced improvement is more distinct in the films annealed at a higher temperature. In addition, when measured at a higher frequency or at a larger electric field, the films show better fatigue properties, and the improvement caused by stress is more evident. The experimental results can be explained well by the mechanism in which the charged defects pin the domain walls during electric cycling.
