Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1595232 | Solid State Communications | 2009 | 4 Pages |
Abstract
We have studied the magnetization of Ni dot with 50 to 70 nanometer diameter and 12 nanometer thickness using a magnetic force microscopy with an in-plane magnetic field. The Ni dots were prepared using self-assembled dot patterns with poly (styrene-b-methyl mathacrylate) diblock copolymers on Ni film and ion etching. It was found that the remanent magnetization direction of the dot was perpendicular to the plane as prepared. From the vibrating sample magnetometer measurement, a hysteresis loop was found in the perpendicular magnetization. When an in-plane external magnetic field was applied, the magnetization was rotated into a horizontal direction with low coercivity along the field direction.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Yongseok Kim, Young-Soo Seo, Taewan Kim, Naesung Lee, Yongho Seo,