| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1595737 | Solid State Communications | 2007 | 4 Pages |
Abstract
High-quality cc-axis-oriented La2/3Sr1/3MnO3−δ (LSMO) films have been grown directly on Si(001) wafers by DC-magnetron sputtering without prechemical treatment of the substrate surface. The highly-oriented films have flat surface morphology and bean-like grains on the surface. It is suggested that self-assembly growth may be the intrinsic growth mechanism of these cc-axis-oriented LSMO films on Si. The magnetic and electrical transport properties are measured and it is found that there exists a large low-field magnetoresistance (LFMR) over a wide temperature range down to 5 K, which is attributed to spin-dependent scattering at grain boundaries in the films.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Z.G. Sheng, Y.P. Sun, X.B. Zhu, B.C. Zhao, R. Ang, W.H. Song, J.M. Dai,