Synchrotron X-ray diffraction study of ZnTe at high pressure

ZnTe has been studied at high pressure to 76 GPa and at room temperature in a diamond-anvil cell using angle-dispersive X-ray diffraction technique with synchrotron radiation and an imaging plate detector. The equation-of-state parameters of the two high-pressure phases of ZnTe were for the first time derived to be B0=91.3(7.0)GPa and B0′=0.8(1.0) for the cinnabar-type phase and B0=134(5)GPa and B0′=2.4(1) for the Cmcm-type phase, respectively.