Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1595936 | Solid State Communications | 2007 | 4 Pages |
Abstract
Investigations on the electrical switching behavior and thermal studies using Alternating Differential Scanning Calorimetry have been undertaken on bulk, melt-quenched Ge22Te78âxIx (3â¤xâ¤10) chalcohalide glasses. All the glasses studied have been found to exhibit memory-type electrical switching. The threshold voltages of Ge22Te78âxIx glasses have been found to increase with the addition of iodine and the composition dependence of threshold voltages of Ge22Te78âxIx glasses exhibits a cusp at 5 at.% of iodine. Also, the variation with composition of the glass transition temperature (Tg) of Ge22Te78âxIx glasses, exhibits a broad hump around this composition. Based on the present results, the composition x=5 has been identified as the inverse rigidity percolation threshold at which Ge22Te78âxIx glassy system exhibits a change from a stressed rigid amorphous solid to a flexible polymeric glass. Further, a sharp minimum is seen in the composition dependence of non-reversing enthalpy (ÎHnr) of Ge22Te78âxIx glasses at x=5, which is suggestive of a thermally reversing window at this composition.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Pulok Pattanayak, S. Asokan,