Article ID Journal Published Year Pages File Type
1596298 Solid State Communications 2006 5 Pages PDF
Abstract

Shock reactions between CX4 (X=Br or I) and NaN(CN)2 were investigated to prepare carbon nitrides. The post shock samples were characterized by the powder X-ray diffraction (XRD) technique. The XRD spectrum of the product showed a peak in the range of 0.324–0.336 nm in dd-value corresponding to the (002) basal plane diffraction in graphitic structure. Elemental analysis (C, H, N, O) of the product showed that the atomic ratio of nitrogen to carbon (N/C) ranged from 0.38 to 1.3. Analysis of data revealed that the dd-value increased and the nitrogen content decreased with the increase of the impact velocity.

Related Topics
Physical Sciences and Engineering Materials Science Materials Science (General)
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