Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1596399 | Solid State Communications | 2007 | 4 Pages |
Abstract
We report the infrared specular reflectivity of Cox(SiO2)1âx (xâ¼0.85, 0.55, 0.38) films on SiO2 glass spanning from a metal-like to insulating behavior. While films for xâ¼0.85 show carrier metallic shielding and hopping conductivity, for xâ¼0.65 and lower concentrations, the nanoparticles' number and size promote a localization edge near the highest longitudinal optical frequency. Such an edge is associated with a reflectivity minimum and a higher frequency band connoting strong electron-phonon interactions, carrier phonon assisted hopping, and polaron formation. Optical conductivity fits with current polaron models provide grounds toward a microscopic understanding of transport properties in these as-prepared granular films.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Néstor E. Massa, Juliano C. Denardin, Leandro M. Socolovsky, Marcelo Knobel, Fernando Pablo de la Cruz, Xixiang Zhang,