| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1596916 | Solid State Communications | 2006 | 4 Pages |
Abstract
Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were carried out to investigate the spontaneously ordered structure in CdxZn1âxTe epilayers grown on GaAs (100) substrates. The SADP showed superstructure reflections with symmetrical intensity, and the high-resolution TEM (HRTEM) micrographs showed doublet periodicity in the contrast of the {100} lattice planes. The results of the SADP and the HRTEM measurements showed a Cu3Au-type ordered structure was formed in the CdxZn1âxTe epilayer. The present results can help improve understanding of the Cu3Au-type ordered structures in CdxZn1âxTe epilayers grown on GaAs substrates.
Keywords
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
H.S. Lee, S. Yi, T.W. Kim, Y.J. Park, J.Y. Lee, M.S. Kwon, H.L. Park,