Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1599909 | Intermetallics | 2015 | 5 Pages |
Abstract
Available data on the temperature dependence of yield stress and of associated activation volume of high-purity NiAl single crystals between 76 and 205Â K have been analyzed within the framework of a solid-solution hardening model, which is based on the concept of depinning of an edge-dislocation segment from several randomly dispersed, isolated, point defects simultaneously. The vacancies in NiAl single crystals act as point-defect obstacles to the stress-assisted thermally-activated glide of edge dislocations, and their concentration is estimated as about 10Â at.%. The product of yield stress and associated activation volume (â0.146Â eV) is found to be independent of temperature and yield stress, as envisaged in the model.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
M.Z. Butt, Dilawar Ali,