Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1600522 | Intermetallics | 2012 | 4 Pages |
Abstract
The X-ray powder diffraction pattern of NbSi1.9 prepared by heating Nb and Si powders with Na at 900 K for 48 h in Ar was analyzed by the Rietveld method. The broadening peaks of X-ray reflections suggested stacking faults of the C40 structure. The XRD pattern was simulated with a stacking fault model using DIFFaX.
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Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Hisanori Yamane, Hiroto Sato, Takahiro Yamada,