Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1606037 | Journal of Alloys and Compounds | 2016 | 4 Pages |
Abstract
Yttrium Iron Garnet (YIG) films were prepared on Si substrates by Chemical Solution Deposition (CSD) technique using acetic acid and deionized water as solvents. Well-crystallized and crack-free YIG films were obtained when annealed at 750 °C and 850 °C respectively, showing a low surface roughness of several nanometers. When annealed at 750 °C for 30 min, the saturated magnetization (Ms) and coercive field (Hc) of YIG films were 0.121 emu/mm3 (4ÏMs = 1.52 kGs) and 7 Oe respectively, which were similar to that prepared by PLD technique. The peak-to-peak linewidth of ferromagnetic resonance (FMR) was 220 Oe at 9.10 GHz. The results demonstrated that CSD was an excellent technique to prepare high quality yttrium iron garnet (YIG) films on silicon, which could provide a lower-cost way for large-scale production on Si-based integrated devices.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Xin Guo, Ying Chen, Genshui Wang, Yuanyuan Zhang, Jun Ge, Xiaodong Tang, Freddy Ponchel, Denis Rémiens, Xianlin Dong,