| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1608577 | Journal of Alloys and Compounds | 2015 | 5 Pages |
•A positive magnetoresistance (MR) effect was observed on our Fe3O4/Si film.•The unique MR effect is distinct from the usual MR effect in Fe3O4 film.•HRTEM, XRD, AFM and XMCD techniques are performed to study the anomalous MR effect.•We proposed a new conduction mechanism to explain the anomalous MR effect.
A surprising inverse (positive) MR effect was observed in thin film of magnetite (Fe3O4) grown on Si substrate by pulsed laser deposition (PLD). Transmission electron microscopy (TEM) and X-ray diffraction (XRD) measurements show a highly (111)-textured growth and single phase nature of Fe3O4 thin film. X-Ray Magnetic Circular Dichroism (XMCD) and X-ray absorption spectroscopy (XAS) were employed to exclude the existence of γ-Fe2O3. The surface morphology of the film was investigated by atomic force microscopy (AFM). Based on the aforementioned studies, we proposed a spin dependent conduction mechanism to explain the observed anomalous MR effect.
Graphical abstractFigure optionsDownload full-size imageDownload as PowerPoint slide
