Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1609081 | Journal of Alloys and Compounds | 2015 | 4 Pages |
•NBT–BT films have been successfully prepared on polycrystalline Ni substrates.•Planar defects related to the (Bi2O2)2+ layers are parallel to (1 0 0) plane of thin films.•Complex planar defects contain edge-sharing TiO6 octahedra with the Bi cations residing in the cavities formed by the octahedral network.
Two types of planar defects are found in 0.95(Na0.5Bi0.5)TiO3–0.05BaTiO3 lead-free piezoelectric thin films prepared on polycrystalline Ni metal substrates. The atomic structures of these defects are characterized by means of aberration-corrected scanning transmission electron microscopy. The first type of planar defects is related to the (Bi2O2)2+ layers parallel to (1 0 0) plane of thin films. The second type of planar defects is determined as complex planar defects made up of edge-sharing TiO6 octahedra with the Bi cations residing in the cavities formed by the octahedral network. The formation of the Bi-rich defects is believed to affect the physical properties of the thin films.
Graphical abstractGraphic abstract contains an atomic-resolution high-angle annular dark field image (left) and the structural model (right) of a novel type of planar faults in 0.95(Na0.5Bi0.5)TiO3–0.05BaTiO3 lead-free piezoelectric thin films.Figure optionsDownload full-size imageDownload as PowerPoint slide