Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1610839 | Journal of Alloys and Compounds | 2014 | 7 Pages |
Abstract
The creation of secondary phases, such as Cu2âxSe and SnSe, and their influence on electrical properties of Cu2SnSe3 (CTSe) thin films fabricated by selenization of Cu-Sn metal precursors are investigated. The Cu2âxSe content in CTSe films is estimated via deconvolution of grazing incidence X-ray diffraction (GIXRD) patterns, and the results suggest that the Cu2âxSe content increases with the increasing Cu/Sn ratio in metal precursors. We also found that using Se and SnSe mixture powders as Se source is an effective approach to suppress the creation of Cu2âxSe secondary phase. Meanwhile, selective etching of Cu2âxSe is realized by potassium cyanide (KCN) solution. Hall measurement results reveal that the secondary phase of Cu2âxSe rather than SnSe makes major contribution to the high carrier concentration (larger than 1018Â cmâ3) of CTSe films. The approach to further decrease the carrier concentration in CTSe films is discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Zeguo Tang, Yuki Nukui, Kiichi Kosaka, Naoki Ashida, Hikaru Uegaki, Takashi Minemoto,