Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1611667 | Journal of Alloys and Compounds | 2014 | 7 Pages |
Abstract
X-ray diffraction (XRD), scanning electron microscopy (SEM), density thermoelectric power, and transport properties of the as prepared nanocrystalline NaxV2O5â
nH2O xerogel thin films (0 ⩽ x ⩽ 20 mol%) were investigated. These films have been produced by the sol-gel technique (colloidal route). XRD revealed that the samples are highly orientated nanocrystals and all samples show almost the same X-ray diffraction patterns with different lattice constant. The particle size was found to be about 7.5 nm. In SEM the porosity and microstructure of NaxV2O5â
nH2O thin films can be tuned effectively by adjusting the concentration of the Na1+ ions in the electrolytic solution. The density of the samples increases with increasing Na-content. The samples are n-type semiconductor according to the thermoelectric power. The thermoelectric power increases with increasing Na-content. The electrical conductivity shows that all samples are semiconductor and it increases with increasing Na-content. The activation energy decreases with increasing Na-content. The conduction was confirmed to obey the non-adiabatic small polaron hopping.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
M.M. El-Desoky, M.S. Al-Assiri, A.A. Bahgat,