| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1611709 | Journal of Alloys and Compounds | 2014 | 6 Pages |
Abstract
The temperature and voltage-polarity dependent leakage current behavior of pulsed laser deposited Ag/0.5Ba(Zr0.2Ti0.8)O3-0.5(Ba0.7Ca0.3)TiO3/LaNiO3 thin-film capacitor is thoroughly investigated. At fields below 50Â kV/cm, the leakage current is Ohmic across both the interfaces. The negative differential resistance behavior is observed in low fields at 300Â K. The space charge limited current, with distinct trap-filling and trap-filled regions, dominates positive bias current at medium fields (60-150Â kV/cm) and higher temperatures, whereas, the Poole-Frenkel Emission governs the conduction above150Â kV/cm. The onset field of Poole-Frenkel Emission decreases with the increasing temperature. Schottky Emission controls the negative bias current at higher fields with 0.43Â eV zero field barrier height.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Chandan Bhardwaj, Davinder Kaur,