Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1611755 | Journal of Alloys and Compounds | 2014 | 6 Pages |
Abstract
Transport properties of as-deposited and annealed Bi0.5Sb1.5Te3 (p-type) and Bi2Te2.7Se0.3 (n-type) thin films have been studied. The p-type and n-type thin films were annealed between 150 and 300 °C. Temperature dependence of the transport properties and effect of annealing are described for both types. The role of the crystallization and the defects in relation with the atomic composition are studied for the different annealed thin films.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
D. Bourgault, B. Schaechner, C. Giroud Garampon, T. Crozes, N. Caillault, L. Carbone,