Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1613071 | Journal of Alloys and Compounds | 2014 | 4 Pages |
Abstract
Synchrotron extended X-ray absorption fine structure (EXAFS) of Zn K-edge and X-ray diffraction (XRD) have been employed to study the lattice deformation of wurtzite MgxZn1−xO alloys (0 ⩽ x ⩽ 0.14) grown on sapphire substrates by metalorganic chemical vapor deposition (MOCVD). Our results reveal that Mg concentration increasing leads to the enhancement of σ-bonding of Zn–O and lattice constant a while resulting in depression of π-bonding of Zn–O and lattice constant c. With increasing from x = 0 to x = 0.14, the c/a ratio significantly decreases from 1.6014 to 1.5906, while the internal parameter u decreases only slightly from 0.3826 to 0.3820. This suggests that the u has a much smaller sensitivity for dilute Mg substitution.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Wei Zheng, Zhe Chuan Feng, Jyh-Fu Lee, Dong-Sing Wuu, Rui Sheng Zheng,