| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1614711 | Journal of Alloys and Compounds | 2013 | 5 Pages |
Abstract
⺠The nanocrystalline sizes of pure and doped CdSe thin films are confirmed by TEM. ⺠Trap parameter were determined by the thermally stimulated currents technique. ⺠Different methods used to evaluate the trapping parameters from TSC curve. ⺠Electron trap centre decreases in doped samples compared to undoped ones. ⺠Density of trap has been increased after doping.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Alaa S. Al-Kabbi, Kriti Sharma, G.S.S. Saini, S.K. Tripathi,