Compositionally graded bismuth ferrite thin films

The compositionally graded (Bi0.92La0.08)(Fe1−xZnx)O3 (x = 0.03, 0.07, and 0.13) thin film was layer-by-layer grown on Pt/Ti/SiO2/Si(1 0 0) substrates without any buffer layers by radio frequency sputtering. This thin film has a pure polycrystalline perovskite structure with random orientation, a dense microstructure, and a low leakage current density. A large remanent polarization of 2Pr ∼ 142.00 μC/cm2 and a good magnetic behavior of 2 Ms ∼ 27.52 emu/cm3 are demonstrated in such a thin film. The applied electric fields and measurement frequencies strongly affect its fatigue endurance, that is, its fatigue endurance was degraded with decreasing frequencies and electric fields.

► A polycrystalline perovskite structure with random orientations and a low leakage current density. ► A large remanent polarization of 2Pr ∼ 142.00 μC/cm2. ► Applied electric fields and frequencies strongly affect its fatigue endurance.