| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1619010 | Journal of Alloys and Compounds | 2011 | 7 Pages |
Zn1−xCrxTe (x = 0.0 and 0.05) films were grown on Si(1 0 0) substrate by using thermal evaporation method. The structure of the films was investigated by X-ray diffraction and it showed the formation of ZnCrTe phase with an amorphous background, which indicated poor crystallinity. Composition analysis by XPS disclosed the presence of antiferromagnetic Cr2O3 and Cr precipitates. Magnetic domains were observed by using magnetic force microscopy at ambient temperature and the result showed anisotropic domains with an average size of 3.5 nm. Magnetic field dependence of magnetic moment measurements showed obvious hysteresis loop with a coercive field of 121 Oe at 300 K. Temperature dependence of magnetic moment showed short-range ferromagnetic order. The Curie temperature was estimated to be 354.5 K.
Graphical abstractFigure optionsDownload full-size imageDownload as PowerPoint slideResearch highlights▶ ZnTe and Cr doped ZnTe films were deposited on Si(1 0 0) by thermal evaporation method. ▶ Structural analysis showed the presence of cubic ZnCrTe with an amorphous background due to the poor crystallinity of ZnCrTe/CrTe phase. ▶ XPS analysis revealed ZnCrTe/CrTe phase with +2 valence state. Also, it was confirmed the presence of secondary phases such as Cr2O3 and Cr, which are antiferromagnetic in nature. ▶ MFM observation showed anisotropic domains with an average size of 3.5 nm. ▶ M–H measurements showed obvious hysteresis loop even at 300 K. ▶ M–T measurements showed short-range ferromagnetic behavior and it persisted up to 354.5 K. ▶ The cubic ZnCrTe and amorphous ZnCrTe/CrTe is believed to be the reason for the observed ferromagnetic behavior.
