Structural, optical and electrical characterization of chemically deposited CdSe thin films

Cadmium selenide (CdSe) thin films have been deposited on glass substrate. CdSe thin films were characterized by various techniques such as X-ray diffraction, scanning electron microscopy and UV–vis–NIR double beam spectrophotometer. The electrical and thermo-electrical properties are also studied. The X-ray diffraction analysis shows that the film samples are in cubic crystal structure. The optical band gap energy (Eg) was found to be 1.7 eV.