| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1621935 | Journal of Alloys and Compounds | 2009 | 4 Pages |
Abstract
This work investigated the properties of Cr doped ZnO (Zn1âxCrxO) thin films with different doping concentrations (x = 0.05, 0.15, 0.30) on a Si (1 0 0) substrate using RF magnetron sputtering. These films have been characterized by powder X-ray diffraction (XRD), atomic force microscopy (AFM) and vibrating sample magnetometer (VSM) measurements to investigate structural, morphological and magnetic properties. XRD results reveal that the wurtzite structure deviates for the films with higher concentrations of Cr. The VSM measurements show the ferromagnetic behaviour for all the Cr doped ZnO films at room temperature.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
J. Elanchezhiyan, K.P. Bhuvana, N. Gopalakrishnan, B.C. Shin, W.J. Lee, T. Balasubramanian,