Article ID Journal Published Year Pages File Type
1622625 Journal of Alloys and Compounds 2009 4 Pages PDF
Abstract

Sm-doped CdO thin films (0.4, 1.1, 3, 7.5, and 9.3%) have been prepared by a vacuum evaporation method on glass and Si wafer substrates. The prepared films were characterised by X-ray fluorescence, X-ray diffraction, UV–VIS–NIR absorption spectroscopy, and dc-electrical measurements. Experimental results indicate that Sm3+ doping creates a slight compressive stress in the CdO crystalline structure and changes (and controls) the optical and electrical properties. The bandgap of CdO was suddenly narrowed by about 17% due to a light (0.4%) doping with Sm3+ ions. Then, as the Sm doping level was increased, the energygap was slightly increasing reaching a steady state (2.17 eV). This variation was explained by the available bandgap narrowing (BGN) models. The electrical behaviour of Sm-doped CdO films shows that they are degenerate semiconductors of energygaps 1.87–2.17 eV. The 0.4% Sm-doped CdO film shows increase in its mobility by about 6 times, conductivity by 36 times, and carrier concentration by 6 times, relative to undoped CdO film. From transparent-conducting-oxide point of view, Sm is sufficiently effective for CdO doping like other metallic dopants such as In, Sn, Sc, and Y.

Related Topics
Physical Sciences and Engineering Materials Science Metals and Alloys
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