| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1622875 | Journal of Alloys and Compounds | 2009 | 4 Pages |
Abstract
Ordered mesoporous titania (MT) thin films have been grown on Si and indium tin oxides (ITO) substrates by evaporation-induced self-assembly (EISA) technique. The films have honeycomb-like structures and are consisted of anatase nanocrystallites, as evidenced from Raman spectra and high resolution transmission electron microscopy. The band-gap energies of the mesoporous titania thin films are larger than that of bulk TiO2 and are tunable through controlling film processing. Refractive index and extinction coefficient of the mesoporous titania thin films were determined using spectroscopic ellipsometry and were found to depend on the film thickness.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Yue Shen, Junchao Tao, Feng Gu, Lu Huang, Jian Bao, Jiancheng Zhang, Ning Dai,