Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1623121 | Journal of Alloys and Compounds | 2008 | 7 Pages |
Titanium monoxide thin films were prepared using electron beam evaporation technique onto glass substrates of thicknesses 50, 500 and 1000 nm. The structural investigations was carried out to the as-deposited films and it was amorphous in nature. Transmittance measurements in the wavelength range (350–2000 nm) were used to calculate the refractive index n and the absorption index k using Swanepole's method. The optical band gap Egopt, optical conductivity σopt, complex dielectric constant, relaxation time τ and dissipation factor tan δ were determined. The analysis of the optical absorption data indicates that the optical band gap Eg was indirect transitions. According to Wemple and Didomenico method, the optical dispersion parameters Eo and Ed were determined.