| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1623413 | Journal of Alloys and Compounds | 2008 | 4 Pages |
Abstract
The swift heavy ion-induced changes in the surface morphology of Ge20Se74Bi6 thin films are observed using atomic force microscopy. Ge20Se74Bi6 thin films were irradiated with Ni ion of 75Â MeV energy and the beam current during irradiation was 5Â pnA and fluence was varied for different samples from 5Â ÃÂ 1012 to 1014Â ions/cm2. The AFM micrographs indicate special features on the surface resulting from electronic energy loss.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
Pratibha Sharma, M. Vashistha, V. Ganesan, I.P. Jain,