The application of the in situ high-temperature X-ray diffraction quantitative analysis

An extending RQA standardless method is applied to in situ high-temperature quantitative analysis of Cu2O–Al2O3–SiO2 pseudo-ternary system. By carrying out the refinement of the in situ high-temperature XRD data according to the designed uniform refining strategy, we analyzed the influences of the refined variables on the analytical results such as the phase fraction and the residuals. It indicates that the thermal diffuse scattering function gives a satisfactory fitting for the background. The refinements of temperature factors of atoms and lattice parameters of unit cells are the prerequisite for the refinements of the other structure factors, and the preferred orientation can be effectively reduced in the RQA method for anisotropic crystalline phases. The reliable results were obtained and the precision has reached 0.1–2.3%.