Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1624910 | Journal of Alloys and Compounds | 2008 | 6 Pages |
Abstract
Ca(Zr0.05Ti0.95)O3 (CZT) thin films were prepared by the polymeric precursor method by spin-coating process. The films were deposited on Pt(1 1 1)/Ti/SiO2/Si(1 0 0) substrates and annealed at 650 °° C for 2, 4, and 6 h in oxygen atmosphere. Structure and morphology of the CZT thin films were characterized by the X-ray diffraction (XRD), Fourier-transform infrared spectroscopy (FT-IR), atomic force microscopy (AFM) and field-emission scanning electron microscopy (FEG-SEM). XRD revealed that the film is free of secondary phases and crystallizes in the orthorhombic structure. The annealing time influences the grain size, lattices parameter and in the film thickness.
Related Topics
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Metals and Alloys
Authors
L.S. Cavalcante, A.Z. Simões, M.O. Orlandi, M.R.M.C. Santos, J.A. Varela, E. Longo,