Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1625673 | Journal of Alloys and Compounds | 2007 | 5 Pages |
Abstract
Pure and Ti-doped copper nitride films were prepared by cylindrical magnetron sputtering on glass substrates at room temperature. The preferred orientation for copper nitride films changes from [1 1 1] for undoped film to [1 0 0] for Ti-doped films. The variation of surface morphology correlates to that of preferred orientation resulting from the variation of Ti-doped content. The electrical resistivity and optical band gap increases as the Ti-doped content increases.
Related Topics
Physical Sciences and Engineering
Materials Science
Metals and Alloys
Authors
X.Y. Fan, Z.G. Wu, G.A. Zhang, C. Li, B.S. Geng, H.J. Li, P.X. Yan,